US Patent Issued to Micron Technology on March 17 for "Adaptable charge loss scanning cadence in a memory sub-system" (Colorado Inventor)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,580,037, issued on March 17, was assigned to Micron Technology Inc. (Boise, Idaho).

"Adaptable charge loss scanning cadence in a memory sub-system" was invented by Steven Michael Kientz (Westminster, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system includes a memory device and a processing device operatively coupled with the memory device to perform operations including determining to perform a first scan operation on a first block of a plurality of blocks of the memory device; responsive to determining to perform the first scan operation, adding an indication of the first scan operation to a queue of pending scan operations corresponding ...