US Patent Issued to Micron Technology on June 30 for "NAND detect empty page scan using subsets of wordlines on a page" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,961, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"NAND detect empty page scan using subsets of wordlines on a page" was invented by Christina Papagianni (San Jose, Calif.), Murong Lang (San Jose, Calif.), Peng Zhang (Los Altos, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A controller of a memory device may identify a plurality of word line groups, included in a block of a memory of the memory device, that include erased pages of the block. The controller may identify a subset of word line groups, of the plurality of word line groups, for a NAND detect empty page (NDEP) scan...