US Patent Issued to Micron Technology on June 30 for "Apparatuses and methods for testing memory devices" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,967, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho).

"Apparatuses and methods for testing memory devices" was invented by Takamasa Suzuki (Tokyo), Yasushi Matsubara (Isehara, Japan) and Harutaka Makabe (Sagamihara, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Self-test circuits of memory devices disclosed herein may include circuitry that adjusts the correspondence between logical and physical addresses to match pre-repair mapping of memory locations. That is, if a memory device has been repaired by remapping logical addresses to new physical addresses, the circuitry of the test circuit restores the pre-repair mappi...