US Patent Issued to Micron Technology on June 2 for "Failure fault tolerance in distributed memory systems" (Texas Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,552, issued on June 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Failure fault tolerance in distributed memory systems" was invented by Craig William Warner (Coppell, Texas) and Tony M. Brewer (Plano, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed in some examples are methods, systems, devices, and architectures which provide for techniques for memory device and memory fabric redundancy within distributed memory systems. In some examples, two memory devices are paired and each stores a same set of data such that writes to the memory devices are duplicated and reads may be satisfied from either device. In some examples, a...