US Patent Issued to Micron Technology on June 2 for "Error detection and classification at a memory device" (Idaho Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,519, issued on June 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Error detection and classification at a memory device" was invented by Aaron P. Boehm (Boise, Idaho) and Scott E. Schaefer (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for error detection and classification are described. A memory device may read a codeword from a memory and generate a first set of syndrome bits for the codeword. The memory device may use the first set of syndrome bits to generate a first error detection bit. The memory device may generate a second set of syndrome bits for the codeword and use the second set of...