US Patent Issued to Micron Technology on June 2 for "Disturb tracking among multiple erase blocks coupled to a same string" (Singaporean, Japanese, American, Italian Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,645,582, issued on June 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Disturb tracking among multiple erase blocks coupled to a same string" was invented by Akira Goda (Setagaya, Japan), Kishore K. Muchherla (San Jose, Calif.), Shyam Sunder Raghunathan (Woodlands, Singapore), Leo Raimondo (Avezzano, Italy), Jung Sheng Hoei (Newark, Calif.), Xiangang Luo (Fremont, Calif.), Ashutosh Malshe (Fremont, Calif.) and Jianmin Huang (San Carlos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus can comprise a memory array comprising a plurality of strings of memory cells. Each string of the plurality of strings can comprise: a first g...