US Patent Issued to Micron Technology on July 7 for "Selective use of a word line monitoring procedure for reliability-risk word lines" (California Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,676,200, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho).

"Selective use of a word line monitoring procedure for reliability-risk word lines" was invented by Yu-Chung Lien (San Jose, Calif.), Ekamdeep Singh (San Jose, Calif.) and Zhenming Zhou (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some implementations, a memory device may receive, from a host device, a single-level cell (SLC) program command instructing host data to be written to one or more subblocks of memory. The memory device may determine whether a word line associated with a subblock, of the one or more subblocks, is associated with a reliabilit...