US Patent Issued to Micron Technology on July 7 for "Memory die family classification method" (California Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,675,232, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho).

"Memory die family classification method" was invented by Yang Liu (San Jose, Calif.), Zhenlei Shen (Milpitas, Calif.) and Aaron Lee (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Processing logic of a memory sub-system to measure a set of slow charge loss (SCL) values, wherein each SCL value of the set of slow charge loss values corresponds to a memory die of a set of memory dies of a memory sub-system. An ordered SCL index based on the set of SCL values is generated. Using a die family threshold level, a set of ranges of the ordered SCL index is identif...