US Patent Issued to Micron Technology on July 7 for "Debug and recovery operations for non-removable memory sub-systems" (American, German Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,675,356, issued on July 7, was assigned to Micron Technology Inc. (Boise, Idaho).

"Debug and recovery operations for non-removable memory sub-systems" was invented by Nicholas Terence Heath (Pittsboro, N.C.) and Gaurav Sinha (UnterschleiBheim, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A processing device in a host system detecting a failure of a memory sub-system coupled to the host system and collects debug information from the memory sub-system via a memory sub-system interface. Responsive to determining that the debug information is not sufficient to correct the failure of the memory sub-system, the processing device performing an authent...