US Patent Issued to Micron Technology on Jan. 20 for "Read disturb tracking among multiple erase blocks coupled to a same string" (American, Singaporean, Japanese, Italian Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,288, issued on Jan. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Read disturb tracking among multiple erase blocks coupled to a same string" was invented by Akira Goda (Setagaya, Japan), Niccolo' Righetti (Boise, Idaho), Shyam Sunder Raghunathan (Woodlands, Singapore), Leo Raimondo (Avezzano, Italy) and Kishore K. Muccherla (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus can comprise a memory array comprising multiple erase blocks coupled to a same plurality of strings of memory cells. A controller is configured to monitor a cumulative amount of read disturb stress experienced by a first erase block by: m...