US Patent Issued to Micron Technology on Jan. 20 for "Measuring change in a channel characteristic to detect memory device attack" (California, Washington, Idaho Inventors)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,448, issued on Jan. 20, was assigned to Micron Technology Inc. (Boise, Idaho).

"Measuring change in a channel characteristic to detect memory device attack" was invented by Aaron Boehm (Boise, Idaho), Jeremy Chritz (Seattle), Tamara Schmitz (Scotts Valley, Calif.), David Hulton (Seattle) and Max Vohra (Seattle).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for measuring change in a channel characteristic to detect a memory device attack are described. A system, such as a vehicle system, may include a host device coupled with a memory device. The host device may transmit a first signal to the memory device and may receiv...