US Patent Issued to Micron Technology on Feb. 10 for "Memory sub-system for monitoring mixed mode blocks" (California Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,337, issued on Feb. 10, was assigned to Micron Technology Inc. (Boise, Idaho).

"Memory sub-system for monitoring mixed mode blocks" was invented by Jianmin Huang (San Carlos, Calif.), Xiangang Luo (Fremont, Calif.), Chun Sum Yeung (San Jose, Calif.) and Kulachet Tanpairoj (San Mateo, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus can include a block program erase count (PEC) component. The block PEC component can monitor a quantity of program erase counts (PECs) for each particular type of block of a non-volatile memory array. The block PEC component can further determine which block of the superblock to write host data to next b...