US Patent Issued to Micron Technology on Feb. 10 for "Apparatuses and methods for repairing multiple bit lines with a same column select value" (Idaho Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,615, issued on Feb. 10, was assigned to Micron Technology Inc. (Boise, Idaho).

"Apparatuses and methods for repairing multiple bit lines with a same column select value" was invented by John F. Schreck (Boise, Idaho) and Jason M. Johnson (Boise, Idaho).

According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the disclosure are drawn to apparatuses and methods for repairing multiple bit lines with a same column select value. A memory mat may be bordered by a first gap and a second gap. Each gap includes sets of sense amplifiers and a redundant sense amplifier set. The sense amplifier sets are activated by an enable signal and share a column selec...