US Patent Issued to Micron Technology on Dec. 2 for "Error decoding with soft redundant array of independent NAND (RAIN)" (California Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,758, issued on Dec. 2, was assigned to Micron Technology Inc. (Boise, Idaho).

"Error decoding with soft redundant array of independent NAND (RAIN)" was invented by Mustafa N. Kaynak (San Diego) and Sivagnanam Parthasarathy (Carlsbad, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A controller decodes embedded data from a codeword determined to have errors via a soft decoding process based on a first LLR set assigned to bits of the codeword by a controller. The controller accesses a set of bit-wise redundant array of independent NAND (RAIN) parity bits from the memory device or another memory device in response to determining failure of the sof...