ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,957, issued on Dec. 16, was assigned to Micron Technology Inc. (Boise, Idaho).
"Thermal conduction based batch testing system" was invented by Daniel P. Cram (Boise, Idaho).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and devices for thermal conduction based batch testing system are described. A testing system may include a set of memory devices may arranged on a loading cartridge and placed within the testing system. The testing system may include one or more test boards located in parallel with the memory devices within the testing system. In some cases, the testing system may push the test boards toward the cartridge, causing t...