US Patent Issued to Micron Technology on Aug. 4 for "Atomicity assurance in write through mode" (Chinese Inventor)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,517, issued on Aug. 4, was assigned to Micron Technology Inc. (Boise, Idaho).

"Atomicity assurance in write through mode" was invented by Meng Wei (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A power loss protection failure is detected at a memory device. Based on detecting the power loss protection failure, a count of unused entries in a journal buffer is determined. A host command is received, and a number of entries needed to record the host command to the journal buffer is determined. In response to determining the count of unused entries in the journal buffer includes a least the number of entries needed to record the host command to...