US Patent Issued to Micron Technology on Aug. 18 for "Dynamic read disturb handling using selective scanning" (California Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,712,033, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho).

"Dynamic read disturb handling using selective scanning" was invented by Lei Lin (Fremont, Calif.), Christina Papagianni (San Jose, Calif.), Guang Hu (Mountain View, Calif.) and Murong Lang (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Exemplary methods, apparatuses, and systems including a scan manager for dynamic read disturb handling using selective scanning. The scan manager reads a list of wordlines to be scanned during a read disturb handling of a memory device. The memory device has separately accessible blocks of memory where each block of memor...