US Patent Issued to Micron Technology on Aug. 18 for "Current management during data burst operations in a multi-die memory device" (Italian, American Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,710,868, issued on Aug. 18, was assigned to Micron Technology Inc. (Boise, Idaho).

"Current management during data burst operations in a multi-die memory device" was invented by Biagio Iorio (Luco dei Marsi, Italy), Luca Nubile (Sulmona, Italy), Walter Di Francesco (Avezzano, Italy), Jeremy Binfet (Boise, Idaho), Liang Yu (Boise, Idaho), Yankang He (Mountain View, Calif.) and Ali Mohammadzadeh (Mountain View, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Control logic on a memory die of a multi-die memory sub-system receives, from a memory sub-system controller, a data burst command indicating an upcoming data burst event and determines an expec...