US Patent Issued to Micron Technology on Aug. 11 for "Underfill detection for memory systems" (California Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,956, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).

"Underfill detection for memory systems" was invented by Tomer Eliash (Sunnyvale, Calif.) and Sead Zildzic Jr. (Folsom, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to store data according to a second memory storage process instead of a first memory storage process based on an underfill threshold."

The patent was filed on Jan. 15, 2025, under Application No. 19/022,802.

*For further information, including images, charts and tables, please visit: http://patft....