ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,705,134, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).
"Selective reliability update for error decoding" was invented by Mustafa N. Kaynak (San Diego), Mariano Burich (San Diego), Sivagnanam Parthasarathy (Carlsbad, Calif.) and Eyal En Gad (Freemont, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for decoding data includes determining that a codeword received from a memory device has errors and assigning responsive to the determining, a reliability value to bits of the codeword for a low-density parity check (LDPC) code. The LDPC code employs an irregular H matrix to decode data. The method includes iterativel...