ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,154, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).
"Select gate selective touch up adjustment" was invented by Lei Lin (Fremont, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus that includes a set of memory components of a memory sub-system is disclosed for selectively adjusting a touch up program pulse of an SG. The memory sub-system includes a processing device that detects a condition for performing a select gate (SG) scan for a set of SGs associated with a set of memory components of a memory sub-system. The processing device, in response to detecting the condition for performing the SG scan, access...