US Patent Issued to Micron Technology on Aug. 11 for "Quick charge loss mitigation using two-pass controlled delay" (American, Japanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,995, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).

"Quick charge loss mitigation using two-pass controlled delay" was invented by Kishore Kumar Muchherla (Fremont, Calif.), Dung V. Nguyen (San Jose, Calif.), Dave Scott Ebsen (Minnetonka, Minn.), Tomoharu Tanaka (Yokohama, Japan), James Fitzpatrick (Laguna Niguel, Calif.), Huai-Yuan Tseng (San Ramon, Calif.), Akira Goda (Tokyo) and Eric N. Lee (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Exemplary methods, apparatuses, and systems include a quick charge loss (QCL) mitigation manager for controlling writing data bits to a memory device. The QCL mitigatio...