US Patent Issued to Micron Technology on Aug. 11 for "Memory sub-system incomplete shutdown debugging" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,126, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).

"Memory sub-system incomplete shutdown debugging" was invented by Xiaoyang Wang (Shanghai), Yunfei You (Shanghai) and He Sang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure configures a memory sub-system controller to enable debugging incomplete shutdown of a memory sub-system. The controller detects a power-loss event associated with incomplete shutdown of the memory sub-system. The controller, in response to detecting the power-loss event associated with the memory sub-system, retrieves a subset of debugging fields. The controller stores the sub...