ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,170, issued on Aug. 11, was assigned to Micron Technology Inc. (Boise, Idaho).
"Detecting extrinsic bitline defects" was invented by Tingjun Hu (Singapore), Wai Leong Chin (Singapore) and Chia Yu Kuo (Hukou Town, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the present disclosure configure a memory sub-system controller to detect extrinsic bitline defects. The controller stores a set of data in a set of memory components and performs a set of memory operations for detecting an empty page in a portion of the set of memory components. The controller determines, based on performing the set of memory operations, that the portion of t...