US Patent Issued to Micron Technology on April 14 for "Selecting superblock partitions for scanning in memory devices" (American, Chinese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,189, issued on April 14, was assigned to Micron Technology Inc. (Boise, Idaho).

"Selecting superblock partitions for scanning in memory devices" was invented by Juane Li (San Jose, Calif.), Frederick H. Adi (Castro Valley, Calif.) and Ruipeng Tao (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to: identify a block family comprising a plurality of blocks of the memory device; responsive to determining that none of superblock partitions associated with the block family covers all die fam...