US Patent Issued to Mianyang BOE Optoelectronics Technology, BOE TECHNOLOGY GROUP on June 23 for "Array substrate, testing method and manufacturing method thereof, and displaying device" (Chinese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,666,815, issued on June 23, was assigned to Mianyang BOE Optoelectronics Technology Co. Ltd. (Mianyang, China) and BOE TECHNOLOGY GROUP Co. LTD. (Beijing).

"Array substrate, testing method and manufacturing method thereof, and displaying device" was invented by Liangliang He (Beijing) and Wenli Zhang (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "An array substrate, a testing method and manufacturing method thereof, and a displaying device. According to the disclosure, a plurality of test capacitors connected in parallel, a first connecting wire, a second connecting wire, a first test terminal and a second test terminal are arranged in an array...