US Patent Issued to Mettler-Toledo (Changzhou) Measurement Technology, Mettler-Toledo (Changzhou) Precision Instruments, Mettler-Toledo International Trading (Shanghai) on Sept. 1 for "Filtering method and filtering control apparatus for load cell" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,910, issued on Sept. 1, was assigned to Mettler-Toledo (Changzhou) Measurement Technology Ltd. (Changzhou, China), Mettler-Toledo (Changzhou) Precision Instruments Ltd. (Changzhou, China) and Mettler-Toledo International Trading (Shanghai) Co. Ltd. (Shanghai).

"Filtering method and filtering control apparatus for load cell" was invented by Shenhui Wang (Changzhou, China), Along Wei (Changzhou, China), Qin Sun (Changzhou, China), Qi Wan (Changzhou, China) and Song Zhang (Changzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "These disclosures provide a filtering method and control apparatus for a load cell. The method includes: filtering, by...