ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,895, issued on March 24, was assigned to MERCK PATENT GMBH (Darmstadt, Germany).
"Method for evaluation of a thin-layer chromatography plate" was invented by Michaela Oberle (Darmstadt, Germany), Eric Schunda (Kronberg Im Taunus, Germany) and Robert Fischer (Kronberg Im Taunus, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for evaluation of a thin-layer chromatography plate after performing a separation process that separates components of a sample on the thin-layer chromatography plate comprises a digitization step, wherein at least two digital images are taken that differ with respect to the wavelength range of illumination of t...