US Patent Issued to Memorial Sloan Kettering Cancer Center on Aug. 11 for "Parameter selection model using image analysis" (New York, New Jersey Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,706,214, issued on Aug. 11, was assigned to Memorial Sloan Kettering Cancer Center (New York).

"Parameter selection model using image analysis" was invented by Allan C. Halpern (New York), Steven Q. Wang (New York) and Douglas Comrie Canfield (Short Hills, N.J.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Described herein are systems and methods of selecting treatment parameters values for treating skin lesions. A device may establish a treatment parameter selection model using a training dataset. The training dataset may include a plurality of examples. Each example may include a sample image of an example skin lesion to which a treatment is administ...