ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,068, issued on Sept. 1, was assigned to MELLANOX TECHNOLOGIES LTD. (Yokneam, Israel).
"Quantum devices and memory structures for quantum metrology" was invented by Elad Mentovich (Tel Aviv, Israel) and Itshak Kalifa (Bat Yam, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Quantum systems, devices, and methods are described herein that enable quantum metrology. An example quantum device includes a first quantum measurement module operably coupled with a first quantum system. The first quantum measurement module applies one or more measurements to the first quantum system and obtains first information associated with the first quantum system ba...