US Patent Issued to MATERIALS ANALYSIS TECHNOLOGY on July 21 for "Testing device and testing system" (Taiwanese Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,576, issued on July 21, was assigned to MATERIALS ANALYSIS TECHNOLOGY INC. (Zhubei City, Taiwan).

"Testing device and testing system" was invented by Yu-Min Hsieh (Hualien County, Taiwan) and Hung-Jen Chen (Hsinchu City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device and a testing system are provided. The testing device includes a circuit mainboard. One side of the circuit mainboard includes a plurality of chip sockets, a plurality of power connectors, and a plurality of signal output connectors. A chip under test is detachably fixed on a chip carrier board. An external power supply can provide power to the chip under test on...