ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,289, issued on March 17, was assigned to Malvern Panalytical B.V. (Almelo, Netherlands).
"X-ray apparatus and method for analysing a sample" was invented by Milen Gateshki (Almelo, Netherlands) and Detlef Beckers (Almelo, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to an X-ray analysis apparatus and an X-ray analysis method for analysing a sample. The X-ray analysis method involves using a first slit between the sample and a position sensitive X-ray detector to analyse the sample, including calculating a detection angle based on a distance L1 between the first slit and the X-ray detector, and the positio...