US Patent Issued to LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST) on April 14 for "Joint nanoscale three-dimensional imaging and chemical analysis" (Luxembourger, German Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,698, issued on April 14, was assigned to LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST) (Esch-sur-Alzette, Luxembourg).

"Joint nanoscale three-dimensional imaging and chemical analysis" was invented by Tom Wirtz (Grevenmacher, Luxembourg) and Florian Vollnhals (Erlangen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for in-situ joint nanoscale three-dimensional imaging and chemical analysis of a sample. A single charged particle beam device is used for generating a sequence of two-dimensional nanoscale images of the sample, and for sputtering secondary ions from the sample, which are analysed using a secondary ion mass spec...