US Patent Issued to Lunit on June 9 for "Method and device for evaluating quality of pathological slide image" (South Korean Inventors)

ALEXANDRIA, Va., June 9 -- United States Patent no. 12,651,340, issued on June 9, was assigned to Lunit Inc. (Seoul, South Korea).

"Method and device for evaluating quality of pathological slide image" was invented by Ga Hee Park (Seoul, South Korea), Kyung Hyun Paeng (Seoul, South Korea), Chan Young Ock (Seoul, South Korea), Sang Hoon Song (Anseong-si, South Korea) and Suk Jun Kim (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computing device includes at least one memory, and at least one processor configured to analyze at least one object expressed in a pathological slide image, evaluate quality of the pathological slide image based on a result of the analyzing, and perform at least ...