US Patent Issued to LUNIT on June 23 for "Method and system for analyzing image" (South Korean Inventor)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,664,650, issued on June 23, was assigned to LUNIT INC. (Seoul, South Korea).

"Method and system for analyzing image" was invented by Minje Jang (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An image analysis method and an image analysis system are disclosed. The method may include extracting training raw graphic data including at least one first node corresponding to a plurality of histological features of a training tissue slide image, and at least one first edge defined by a relationship between the histological features and generating training graphic data by sampling the first node of the training raw graphic data. The method ma...