US Patent Issued to Lunit on April 21 for "Method and system for measuring size change of target lesion in x-ray image" (South Korean Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,809, issued on April 21, was assigned to Lunit Inc. (Seoul, South Korea).

"Method and system for measuring size change of target lesion in x-ray image" was invented by Minchul Kim (Seoul, South Korea), Gunhee Nam (Seoul, South Korea) and Thijs Kooi (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for measuring a size change of a target lesion in an X-ray image is provided, including receiving a first X-ray image including the target lesion and a second X-ray image including the target lesion, calculating an occupancy of a region corresponding to the target lesion in criterion regions in each of the first X-ray image and t...