US Patent Issued to Lumafield on May 26 for "Seed quality analysis using computed tomography" (California, Massachusetts Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,635,595, issued on May 26, was assigned to Lumafield Inc. (Cambridge, Mass.).

"Seed quality analysis using computed tomography" was invented by Andreas Linas Bastian (San Francisco), Sondre Skatter (Oakland, Calif.) and Steven Thomas (Somerville, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein are methods, apparatuses, computer program products, and systems for seed quality analysis using computed tomography. One method can include obtaining computed tomography data representing a germination towel including seedlings; detecting likely seeds and candidate shoots and roots in the computed tomography data representing the germination t...