US Patent Issued to LST on Aug. 25 for "Contact pin and test socket having the same" (South Korean Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,716,914, issued on Aug. 25, was assigned to LST Co. LTD (Asan-si, South Korea).

"Contact pin and test socket having the same" was invented by Gwanhyung Lee (Cheonan-si, South Korea) and Seungdoo Kwon (Cheonan-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a contact pin, and more particularly, to a contact pin installed in a test socket performing a test on a semiconductor device and a test socket having the same. The present invention discloses a contact pin including: a first member (100) including a first terminal (120) disposed at one end thereof to contact one of a test terminal and a terminal of a se...