ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,677, issued on Sept. 29, was assigned to Lenovo (Singapore) Pte. Ltd. (Singapore).

"Scaled-down load test models for testing real-world loads" was invented by Matthew Fardig (Boonville, Ind.), Sathish Kumar Ganesan (Morrisville, N.C.), Joshua Smith (Milton, N.C.) and Timothy Robbins (Avon, Ind.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, apparatus, and program products that can generate scaled-down load test models for testing real-world loads are disclosed herein. One method includes providing a test environment of a system including multiple nodes. The test environment includes virtual nodes corresponding to the system nodes ...