US Patent Issued to LEICA MICROSYSTEMS CMS on June 2 for "Method for extracting a part of a microscopic sample" (German Inventor)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,644,803, issued on June 2, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).

"Method for extracting a part of a microscopic sample" was invented by Falk Schlaudraff (Wetzlar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes applying a liquid cover to a microscopic sample to obtain a processed microscopic sample, generating at least one marker for a part of the processed microscopic sample using an imaging system, removing at least a part of the liquid cover from the processed microscopic sample to obtain an uncovered microscopic sample, and extracting a part of the uncovered microscopic sample, based on the at least ...