ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,242, issued on April 7, was assigned to LEICA MICROSYSTEMS CMS GMBH (Wetzlar, Germany).
"Inclined-plane microscope having improved collection efficiency" was invented by Florian Fahrbach (Mannheim, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inclined plane microscope includes a detection assembly for collecting scattered light and/or fluorescent light from regions of a sample volume illuminated by a light sheet, wherein the detection assembly, on its side facing away from the sample volume, is configured to image a real intermediate image of the regions of the sample illuminated by the light sheet, and wherein the real intermediate ima...