US Patent Issued to Leica Instruments (Singapore) on May 20 for "Systems, methods, and computer programs for a microscope and microscope system" (Swiss Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,632, issued on May 20, was assigned to Leica Instruments (Singapore) Pte. Ltd. (Singapore).

"Systems, methods, and computer programs for a microscope and microscope system" was invented by Yifan Jiang (Heerbrugg, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "Examples relate to systems, methods and computer programs for a microscope, and to a microscope system comprising such as system. The system for the microscope comprises one or more processors and one or more storage devices. The system is configured to obtain image data from an optical imaging sensor of the microscope. The image data comprises at least a first frame and a subsequen...