US Patent Issued to LEICA GEOSYSTEMS on June 23 for "Reference free calibration method for a point cloud measuring module combined with a geodetic single point measurement unit" (Swiss Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,265, issued on June 23, was assigned to LEICA GEOSYSTEMS AG (Heerbrugg, Switzerland).

"Reference free calibration method for a point cloud measuring module combined with a geodetic single point measurement unit" was invented by Christian Niklaus (Bad Ragaz, Switzerland) and Bianca Gordon (Rebstein, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A survey instrument comprising a single point measurement unit, a point cloud measuring module, and a computing unit. The single point measurement unit is configured to generate first measurement data comprising coordinates a point. The point cloud measuring module has a fixed pose relative to the...