US Patent Issued to LEICA GEOSYSTEMS on Feb. 17 for "Method and system for optimizing use of coordinate measuring devices" (Swiss Inventor)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,714, issued on Feb. 17, was assigned to LEICA GEOSYSTEMS AG (Heerbrugg, Switzerland).

"Method and system for optimizing use of coordinate measuring devices" was invented by Markus Steiner (Granichen, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for optimizing simultaneous use of a multitude of coordinate measuring devices at a multitude of locations, comprising: obtaining job information about a multitude of coordinate measuring jobs at the multitude of locations, the job information comprising the position of one or more objects, a time for performing the job, required capabilities of involved devices, and required certificat...