US Patent Issued to LEENO INDUSTRIAL on June 23 for "Test socket and method for fabricating the same" (South Korean Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,436, issued on June 23, was assigned to LEENO INDUSTRIAL INC. (Busan, South Korea).

"Test socket and method for fabricating the same" was invented by Geunsu Kim (Busan, South Korea), Jaehwan Jeong (Busan, South Korea), Jungchul Shin (Busan, South Korea) and Seungha Baek (Busan, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insu...