US Patent Issued to LEADWAY (HK) on June 30 for "Diagnostic testing kit" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. D1,132,458, issued on June 30, was assigned to LEADWAY (HK) Ltd. (Hong Kong).

"Diagnostic testing kit" was invented by Tao Liping (Sheung Wan, China) and Li Tianhao (Sheung Wan, China).

The patent was filed on Sept. 13, 2021, under Application No. D/807,594.

*For further information, including images, charts and tables, please visit: http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&p=1&u=%2Fnetahtml%2FPTO%2Fsearch-bool.html&r=1&f=G&l=50&co1=AND&d=PTXT&s1=D1132458&OS=D1132458&RS=D1132458

Disclaimer: Curated by HT Syndication....