US Patent Issued to L&T TECHNOLOGY SERVICES on April 21 for "Method and system of determining anomalies in a target system using a large language model" (Indian Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,608,258, issued on April 21, was assigned to L&T TECHNOLOGY SERVICES Ltd. (Chennai, India).

"Method and system of determining anomalies in a target system using a large language model" was invented by Kaushik Halder (Chennai, India) and Madhusudan Singh (Bangalore, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system of determining anomalies in a target system using a large language model (LLM), is disclosed. A processor receives a user experience corresponding to the target system, and specification data of the target system from a user. A first set of parameters is determined based on the user experience and the specification data...