US Patent Issued to Landmark Graphics on April 14 for "Fault interpretation and feature learning on full azimuth stacks" (Texas Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,224, issued on April 14, was assigned to Landmark Graphics Corp. (Houston).

"Fault interpretation and feature learning on full azimuth stacks" was invented by Fan Jiang (Houston) and Konstantin Osypov (Houston).

According to the abstract* released by the U.S. Patent & Trademark Office: "Determining the location, size, and orientation of features within a subterranean formation can be determined by using more than one set of azimuthal data collected along at least two different angle ranges of seismic detection. The azimuthal data collected along one azimuthal range can be stacked and combined. A feature probability map can be generated for each azimuthal data collection using a ...