ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,691, issued on June 30, was assigned to Lam Research Corp. (Fremont, Calif.).

"Reflective fourier ptychography imaging of large surfaces" was invented by Collin Michael Anderson (Berkeley, Calif.), Roderick Mosely (Pleasanton, Calif.), Nerissa Sue Draeger (Fremont, Calif.) and Jerome S. Hubacek (Fremont, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments include reflective-mode Fourier ptychographic microscope (RFPM) apparatuses and methods for using the RFPM. In one example, the RFPM includes a multiple-component light source configured to direct radiation to a surface. The multiple-component light source has a number of indi...