ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,710, issued on Feb. 17, was assigned to Kowa Co. Ltd. (Nagoya, Japan).
"Three-dimensional measurement device" was invented by Jun Takeda (Soka, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "To perform three-dimensional measurement of an object with high accuracy, a dot pattern is generated by a determination process of determining a reference position according to a rule defined by a Poisson disk sampling algorithm, a selection process of selecting one of a plurality of arrangement patterns indicating at least one or more dot arrangements, an arrangement process of arranging dots based on the arrangement pattern selected for the reference pos...